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ICCAD
2006
IEEE

Design and CAD challenges in 45nm CMOS and beyond

14 years 1 months ago
Design and CAD challenges in 45nm CMOS and beyond
With semiconductor industry's aggressive march towards 45nm
David J. Frank, Ruchir Puri, Dorel Toma
Added 16 Mar 2010
Updated 16 Mar 2010
Type Conference
Year 2006
Where ICCAD
Authors David J. Frank, Ruchir Puri, Dorel Toma
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