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14

ET
2006

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Automatic Test Pattern Generation for Resistive Bridging Faults

13 years 4 months ago

Automatic Test Pattern Generation for Resistive Bridging Faults

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An ATPG for resistive bridging faults is proposed that combines the advantages of section-based generation and interval-based simulation. In contrast to the solutions introduced so far, it can handle arbitrary non-feedback bridges between two nodes, including ones detectable at higher resistance and undetectable at lower resistance, and faults requiring more than one vector for detection.

Piet Engelke, Ilia Polian, Michel Renovell, Bernd

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Added	12 Dec 2010
Updated	12 Dec 2010
Type	Journal
Year	2006
Where	ET
Authors	Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker

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