Circular BIST testing the digital logic within a high speed Serdes

High Speed Serializer Deserializers (serdes) are traditionally tested using functional BIST. This paper presents an improved BIST for testing the digital part of a serdes using circular BIST.

• Type: Conference
• Year: 2003
• Where: ITC
• Authors: Graham Hetherington, Richard Simpson
• Keywords: Circular Bist, Functional Bist, Hardware, Improved Bist, ITC 2003