2 search results - page 1 / 1 » Circular BIST testing the digital logic within a high speed ... |
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
High Speed Serializer Deserializers (serdes) are traditionally tested using functional BIST. This paper presents an improved BIST for testing the digital part of a serdes using ci...
ET
2002
13 years 5 months ago
2002
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...