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DAC
2003
ACM

Efficient compression and application of deterministic patterns in a logic BIST architecture

9 years 3 months ago
Efficient compression and application of deterministic patterns in a logic BIST architecture
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern generator (ATPG) and are encoded as linear feedback shift register (LFSR) initial values (seeds); one or more patterns can be encoded into a single LFSR seed. During test application, seeds are loaded into the LFSR with no cycle overhead. The method presented achieves reductions of at least 100x in test data and 10x in tester cycles compared to deterministic ATPG while maintaining complete fault coverage, as confirmed by experimental results on industrial designs. Categories and Subject Descriptors: B.8.1 [Performance and Reliability]: Reliability, Testing and Fault-Tolerance. General Terms: Algorithms, Design.
Peter Wohl, John A. Waicukauski, Sanjay Patel, Min
Added 05 Jul 2010
Updated 05 Jul 2010
Type Conference
Year 2003
Where DAC
Authors Peter Wohl, John A. Waicukauski, Sanjay Patel, Minesh B. Amin
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