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2002

Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST

10 years 2 months ago
Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST
In this paper a novel architecture for scan-based mixed mode BIST is presented. To reduce the storage requirements for the deterministic patterns it relies on a two-dimensional compression scheme, which combines the advantages of known vertical and horizontal compression techniques. To reduce both the number of patterns to be stored and the number of bits to be stored for each pattern, deterministic test cubes are encoded as seeds of an LFSR (horizontal compression), and the seeds are again compressed into seeds of a folding counter sequence (vertical compression). The proposed BIST architecture is fully compatible with standard scan design, simple and flexible, so that sharing between several logic cores is possible. Experimental results show that the proposed scheme requires less test data storage than previously published approaches providing the same flexibility and scan compatibility.
Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wun
Added 18 Dec 2010
Updated 18 Dec 2010
Type Journal
Year 2002
Where ET
Authors Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich
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