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2005
IEEE

An Efficient Random Jitter Measurement Technique Using Fast Comparator Sampling

9 years 7 months ago
An Efficient Random Jitter Measurement Technique Using Fast Comparator Sampling
This paper describes a random jitter measurement technique using simple algorithms and comparator sampling. The approach facilitates using Automated Test Equipment (ATE) to validate devices with multiple, high-speed serial interfaces. The approach combines partial measurements based on individual data edge regions, in contrast to more common approaches that effectively first accumulate data from multiple edge regions. Random jitter is measured accurately even in the presence of deterministic and low-frequency periodic jitter, up to a cutoff frequency.
Dongwoo Hong, Cameron Dryden, Gordon Saksena
Added 25 Jun 2010
Updated 25 Jun 2010
Type Conference
Year 2005
Where VTS
Authors Dongwoo Hong, Cameron Dryden, Gordon Saksena
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