Fault Set Partition for Efficient Width Compression

In this paper, we present a technique for reducing the test length of counter-based pseudo-exhaustive built-in self-testing (BIST) based on width compression method. More formally, the target faults are divided into K groups such that a binary counter can generate a test set for each group. By selecting the size of the binary counter, this technique allows a trade-off between test application time and area overhead. The experimental results demonstrate the efficiency of the proposed technique. In all cases, this low-overhead BIST technique achieves complete fault coverage for the stuck-at faults in reasonable test application time.

• Type: Conference
• Year: 2002
• Where: ATS
• Authors: Emil Gizdarski, Hideo Fujiwara
• Keywords: ATS 2002, Binary Counter, Hardware, Low-overhead Bist Technique, Test Application Time