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» Fault Set Partition for Efficient Width Compression
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ATS
2002
IEEE
108views Hardware» more  ATS 2002»
13 years 9 months ago
Fault Set Partition for Efficient Width Compression
In this paper, we present a technique for reducing the test length of counter-based pseudo-exhaustive built-in self-testing (BIST) based on width compression method. More formally...
Emil Gizdarski, Hideo Fujiwara
VLSID
2005
IEEE
131views VLSI» more  VLSID 2005»
14 years 5 months ago
Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Sh...
DATE
2006
IEEE
134views Hardware» more  DATE 2006»
13 years 10 months ago
Power constrained and defect-probability driven SoC test scheduling with test set partitioning
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...
Zhiyuan He, Zebo Peng, Petru Eles
TCSV
2002
148views more  TCSV 2002»
13 years 4 months ago
A full-featured, error-resilient, scalable wavelet video codec based on the set partitioning in hierarchical trees (SPIHT) algor
Compressed video bitstreams require protection from channel errors in a wireless channel. The threedimensional (3-D) SPIHT coder has proved its efficiency and its real-time capabi...
Sungdae Cho, William A. Pearlman
ITC
1994
IEEE
111views Hardware» more  ITC 1994»
13 years 8 months ago
Simulation Results of an Efficient Defect-Analysis Procedure
For obtaining a zero defect level, a high fault coverage with respect to the stuck-at fault model is often not sufficient as there are many defects that show a more complex behavi...
Olaf Stern, Hans-Joachim Wunderlich