PTS
2010
13 years 3 months ago
2010
This paper addresses the challenge of generating test sets that achieve functional coverage, in the absence of a complete specification. The inductive testing technique works by p...
TCAD
2008
13 years 4 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
NIPS
2004
13 years 6 months ago
2004
The NIPS 2003 workshops included a feature selection competition organized by the authors. We provided participants with five datasets from different application domains and calle...
SNPD
2008
13 years 6 months ago
2008
This paper presents a single project experiment on the fault revealing capabilities of model-based test sets. The tests are generated from UML statecharts and UML sequence diagram...
FORTEST
2008
13 years 6 months ago
2008
Algebraic specifications of data types provide a natural basis for testing data types implementations. In this framework, the conformance relation is based on the satisfaction of a...
DELTA
2008
IEEE
13 years 6 months ago
2008
IEEE
This paper presents a technique that limits the maximum number of specified bits of any pattern in a given test set. The outlined method uses algorithms similar to ATPG, but explo...
ATS
2005
IEEE
13 years 6 months ago
2005
IEEE
Reversibility is of interest in achieving extremely low power dissipation; it is also an inherent design requirement of quantum computation. Logical fault models for conventional ...
ICCAD
1995
IEEE
13 years 8 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...
ICECCS
2000
IEEE
13 years 8 months ago
2000
IEEE
This paper compares three specification-based testing criteria using Mathur and Wong's PROBSUBSUMES measure. The three criteria are specification-mutation coverage, full pred...
GECCO
2006
Springer
13 years 8 months ago
2006
Springer
Achieving a high quality and cost-effective tests is a major concern for software buyers and sellers. Using tools and integrating techniques to carry out low cost testing are chal...