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ISQED
2010
IEEE

Limits of bias based assist methods in nano-scale 6T SRAM

13 years 2 months ago
Limits of bias based assist methods in nano-scale 6T SRAM
Reduced device dimensions and operating voltages that accompany technology scaling have led to increased design challenges with each successive technology node. Large scale 6T SRAM arrays beyond 65nm will increasingly rely on assist methods to overcome the functional limitations imposed by increased variation, reduced overdrive and the inherent read stability/write margin trade off. Factors such as reliability, leakage and data retention establish the boundary conditions for the maximum voltage bias permitted for a given circuit assist approach. These constraints set an upper limit on the potential yield improvement that can be obtained for a given assist method and limit the minimum operation voltage (Vmin). By application of this set of constraints, we show that the read assist limit contour (ALC) in the margin/delay space can provide insight into the ultimate limits for the nano-scale CMOS 6T SRAM.
Randy W. Mann, Satyanand Nalam, Jiajing Wang, Bent
Added 28 Jan 2011
Updated 28 Jan 2011
Type Journal
Year 2010
Where ISQED
Authors Randy W. Mann, Satyanand Nalam, Jiajing Wang, Benton H. Calhoun
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