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2009

Built-in Self-Test for Memory Resources in Virtex-4 Field Programmable Gate Arrays

8 years 11 months ago
Built-in Self-Test for Memory Resources in Virtex-4 Field Programmable Gate Arrays
ABSTRACT: We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the block random access memories (RAMs) in all of their modes of operation including single- and dual-port RAM, first-in first-out (FIFO), error correcting code (ECC), and cascade modes of operation. The BIST architecture and configurations needed to test these block RAMs are presented with implementation, fault detection, and timing analysis.1
Brooks R. Garrison, Daniel T. Milton, Charles E. S
Added 08 Nov 2010
Updated 08 Nov 2010
Type Conference
Year 2009
Where CATA
Authors Brooks R. Garrison, Daniel T. Milton, Charles E. Stroud
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