Sciweavers

Share
ICCAD
1990
IEEE

Partial Detectability Profiles

8 years 11 months ago
Partial Detectability Profiles
Partial detectability profiles are formed by randomly sampling each fault's detectability and are used in estimating the fault coverage of random input test vectors on combinational circuits. Partial detectability profiles are particularly useful for predicting fault coverage for large circuits with a large number of inputs. Predictions made using full and partial detectability profiles are compared.
Paul G. Ryan, W. Kent Fuchs
Added 11 Aug 2010
Updated 11 Aug 2010
Type Conference
Year 1990
Where ICCAD
Authors Paul G. Ryan, W. Kent Fuchs
Comments (0)
books