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2002
IEEE

Self-Testing Second-Order Delta-Sigma Modulators Using Digital Stimulus

10 years 3 months ago
Self-Testing Second-Order Delta-Sigma Modulators Using Digital Stimulus
Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is difficult to generate. This paper proposes a novel and robust technique to determine the performance of the modulator, which incorporates simple design-for-testability circuitry. This technique requires only digital stimulus to test the modulator. Hence, it is suitable as an analog signature analyzer used in Built-In Self-Test applications. Simulation results show that this technique is capable of accurately determining the performance of a second-order delta-sigma modulator ADC.
Chee-Kian Ong, Kwang-Ting (Tim) Cheng
Added 16 Jul 2010
Updated 16 Jul 2010
Type Conference
Year 2002
Where VTS
Authors Chee-Kian Ong, Kwang-Ting (Tim) Cheng
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