VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test v...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper presents a procedure for modifying a given set of scan vectors so that the peak power during scan testing is kept below a specified limit without reducing fault coverag...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
We present a test methodology to allow testing high-speed circuits with low-speed ATEs. The basic strategy is adding an interface circuit to partially supply test data, coordinate...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is diffic...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
Very Low Voltage (VLV) testing has been proposed to increase flaw detection in bulk silicon CMOS integrated circuits and this paper explores these and additional advantages in the...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
The testing time for a system-on-chip (SOC) is determined to a large extent by the design of test wrappers and the test access mechanism (TAM). Wrapper/TAM co-optimization is ther...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
Fault diagnosis is to predict the potential fault sites in a logic IC. In this paper, we particularly address the problem of diagnosing faults that exhibit the so-called Byzantine...