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EURODAC
1994
IEEE

Testing redundant asynchronous circuits by variable phase splitting

13 years 7 months ago
Testing redundant asynchronous circuits by variable phase splitting
An approach for stuck-at-i and delay-fault testing of redundant circuits without modifying the logic is proposed. The only requirement is the ability to control both phases of each variable independent of each other. The circuit becomes fully testable under very weak assumptions, equivalent to freedom from Single Cube Containment in two-level form. The main existing methods for asynchronous circuit synthesis are demonstrated to satisfy the assumptions and then are testable using the methodology. Heuristics to improve the approach include partial scan and non-scan testing.
Luciano Lavagno, Antonio Lioy, Michael Kishinevsky
Added 08 Aug 2010
Updated 08 Aug 2010
Type Conference
Year 1994
Where EURODAC
Authors Luciano Lavagno, Antonio Lioy, Michael Kishinevsky
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