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DAC
2007
ACM
14 years 6 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
MICRO
2003
IEEE
143views Hardware» more  MICRO 2003»
13 years 11 months ago
VSV: L2-Miss-Driven Variable Supply-Voltage Scaling for Low Power
Energy-efficient processor design is becoming more and more important with technology scaling and with high performance requirements. Supply-voltage scaling is an efficient way to...
Hai Li, Chen-Yong Cher, T. N. Vijaykumar, Kaushik ...
GLVLSI
2006
IEEE
152views VLSI» more  GLVLSI 2006»
13 years 12 months ago
2 Gbps SerDes design based on IBM Cu-11 (130nm) standard cell technology
This paper introduces a standard cell based design for a Serializer and Deserializer (SerDes) communication link. The proposed design is area, power and design time efficient as c...
Rashed Zafar Bhatti, Monty Denneau, Jeff Draper
VISUALIZATION
1998
IEEE
13 years 10 months ago
A general method for preserving attribute values on simplified meshes
Many sophisticated solutions have been proposed to reduce the geometric complexity of 3D meshes. A less studied problem is how to preserve on a simplified mesh the detail (e.g. co...
Paolo Cignoni, Claudio Montani, Roberto Scopigno, ...
DAC
2003
ACM
14 years 6 months ago
Pushing ASIC performance in a power envelope
Power dissipation is becoming the most challenging design constraint in nanometer technologies. Among various design implementation schemes, standard cell ASICs offer the best pow...
Ruchir Puri, Leon Stok, John M. Cohn, David S. Kun...