Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
Energy-efficient processor design is becoming more and more important with technology scaling and with high performance requirements. Supply-voltage scaling is an efficient way to...
Hai Li, Chen-Yong Cher, T. N. Vijaykumar, Kaushik ...
This paper introduces a standard cell based design for a Serializer and Deserializer (SerDes) communication link. The proposed design is area, power and design time efficient as c...
Many sophisticated solutions have been proposed to reduce the geometric complexity of 3D meshes. A less studied problem is how to preserve on a simplified mesh the detail (e.g. co...
Paolo Cignoni, Claudio Montani, Roberto Scopigno, ...
Power dissipation is becoming the most challenging design constraint in nanometer technologies. Among various design implementation schemes, standard cell ASICs offer the best pow...
Ruchir Puri, Leon Stok, John M. Cohn, David S. Kun...