93 search results - page 2 / 19 » A Genetic Testing Framework for Digital Integrated Circuits |
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
This paper introduces a CAD framework for co-simulation of hybrid circuits containing CMOS and SET (Single Electron Transistor) devices. An improved analytical model for SET is al...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
Testing of high performance integrated circuits is becoming increasingly a challenging task owing to high clock frequencies. Often testers are not able to test such devices due to...
ET
2002
13 years 4 months ago
2002
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
CP
1998
Springer
13 years 9 months ago
1998
Springer
In a faulty digital circuit, many (single) faulty gates may explain the observed findings. In this paper we are mostly concerned, not in obtaining alternative diagnoses, but rathe...