93 search results - page 3 / 19 » A Genetic Testing Framework for Digital Integrated Circuits |
ASPDAC
2008
ACM
13 years 7 months ago
2008
ACM
This paper presents an all digital measurement circuit called "gated oscillator" for capturing waveforms of dynamic power supply noise. The gated oscillator is constructe...
ISQED
2009
IEEE
14 years 4 days ago
2009
IEEE
— With continued scaling, reliability is emerging as a critical challenge for the designers of digital circuits. The challenge stems in part from the lack of computationally efï¬...
AIA
2007
13 years 6 months ago
2007
Designers aim at fast but low-power consuming integrated circuits. Since high processing speed always comes with high energy demands, the literature provides several ways to reduc...
ICCAD
2009
IEEE
13 years 3 months ago
2009
IEEE
In this paper, we propose a new technique, referred to as virtual probe (VP), to efficiently measure, characterize and monitor both inter-die and spatially-correlated intra-die va...
AHS
2006
IEEE
13 years 11 months ago
2006
IEEE
The paper presents a novel integrated system in which a number of image processing algorithm are embedded within a Genetic Algorithm (GA) based framework in order to provide an ad...