84 search results - page 1 / 17 » A Line Drawings Degradation Model for Performance Characteri... |
ICDAR
2003
IEEE
13 years 10 months ago
2003
IEEE
Line detection algorithms constitute the basis for technical document analysis and recognition. The performance of these algorithms decreases as the quality of the documents degra...
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
ICPR
2010
IEEE
13 years 10 months ago
2010
IEEE
—In this paper, we present an approach for symbol representation and recognition in line drawings, integrating both the vector-based structural description and pixel-level statis...
ISVLSI
2007
IEEE
13 years 11 months ago
2007
IEEE
In sub-90nm technologies, more frequent hard faults pose a serious burden on processor design and yield control. In addition to manufacturing-time chip repair schemes, microarchit...
CVPR
2000
IEEE
14 years 6 months ago
2000
IEEE
In this paper, an efficient global algorithm for vectorizing line drawings is presented. It first extracts a seed segment of a graphic entity from a raster image to obtain its dir...