4 search results - page 1 / 1 » A Low-Overhead Design for Testability and Test Generation Te... |
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
EURODAC
1994
IEEE
13 years 9 months ago
1994
IEEE
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
GLVLSI
2002
IEEE
13 years 9 months ago
2002
IEEE
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
ICSE
2007
IEEE-ACM
14 years 5 months ago
2007
IEEE-ACM
Most flight software testing at the Jet Propulsion Laboratory relies on the use of hand-produced test scenarios and is executed on systems as similar as possible to actual mission...