As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These “soft errors” can be a nuisance or catastro...
The study of Multiple Soft errors on memory modules caused by radiation effects represents an interesting field of current research. The fault tolerance of these devices in radiati...
Pilar Reyes, Pedro Reviriego, Juan Antonio Maestro...
Cosmic-ray induced soft errors in cache memories are becoming a major threat to the reliability of microprocessor-based systems. In this paper, we present a new method to accurate...
Hossein Asadi, Vilas Sridharan, Mehdi Baradaran Ta...
— As the capacity of the two-dimensional coherent optical memory (2D-COM) increases, the bit error rate (BER) performance of the system is degraded due to increased twodimensiona...
We present an experimental study showing that soft memory errors can lead to serious security vulnerabilities in Java and .NET virtual machines, or in any system that relies on ty...