114 search results - page 3 / 23 » A Memory Soft Error Measurement on Production Systems |
ICCAD
2007
IEEE
14 years 3 months ago
2007
IEEE
Late CMOS scaling reduces device reliability, and existing work has studied the permanent SER (soft error rate) for configuration memory in FPGA extensively. In this paper, we sh...
DSN
2002
IEEE
13 years 11 months ago
2002
IEEE
This paper examines the effect of technology scaling and microarchitectural trends on the rate of soft errors in CMOS memory and logic circuits. We describe and validate an end-to...
MICRO
2007
IEEE
14 years 11 days ago
2007
IEEE
In deep sub-micron ICs, growing amounts of ondie memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. As scaling progresses...
ASPDAC
2005
ACM
13 years 8 months ago
2005
ACM
Ever scaling process technology makes embedded systems more vulnerable to soft errors than in the past. One of the generic methods used to fight soft errors is based on duplicati...
ASPDAC
2006
ACM
14 years 2 days ago
2006
ACM
— Soft errors are becoming a common problem in current systems due to the scaling of technology that results in the use of smaller devices, lower voltages, and power-saving techn...