30 search results - page 1 / 6 » A Method to Reduce the Effect of the Switching Noise in Anal... |
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE
GLVLSI
2003
IEEE
13 years 10 months ago
2003
IEEE
One of the fundamental problems in Deep Sub Micron (DSM) circuits is Simultaneous Switching Noise (SSN), which causes voltage fluctuations in the circuit power/ground networks. In...
DELTA
2006
IEEE
13 years 10 months ago
2006
IEEE
In high speed digital circuits, the inductive effect is more dominant compared to capacitive effect. In particular, as the technology is shrinking, the spacing between interconnec...
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
The placement of on-die decoupling capacitors (decap) between the power and ground supply grids has become a common practice in high performance processor designs. In this paper, ...
VTS
2007
IEEE
13 years 10 months ago
2007
IEEE
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...