30 search results - page 6 / 6 » A Method to Reduce the Effect of the Switching Noise in Anal... |
ASPDAC
2004
ACM
13 years 10 months ago
2004
ACM
As the process technology advances into the deep submicron era, interconnect plays a dominant role in determining circuit performance and signal integrity. Buffer insertion is one...
VLSID
2007
IEEE
14 years 5 months ago
2007
IEEE
Device scaling such as reduced oxide thickness and high electric field has given rise to various reliability concerns. One such growing issue of concern is the degradation of PMOS...
ICCD
2005
IEEE
14 years 1 months ago
2005
IEEE
Abstract— Noise induced by impedance discontinuities from VLSI packaging is one of the leading challenges facing system level designers in the next decade. The performance of IC ...
ICCD
2007
IEEE
14 years 1 months ago
2007
IEEE
In this paper, we propose a novel on-chip voltage drop reduction technique for on-chip power delivery networks of VLSI systems in the presence of variational leakage current sourc...
ICCAD
1995
IEEE
13 years 8 months ago
1995
IEEE
We address the problem of minimizing power consumption in behavioral synthesis of data-dominated circuits. The complex nature of power as a cost function implies that the effects ...