12 search results - page 2 / 3 » A New Approach for Combining Yield and Performance in Behavi... |
TVLSI
2008
13 years 5 months ago
2008
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
ICCAD
2008
IEEE
14 years 2 months ago
2008
IEEE
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
ISLPED
2009
ACM
14 years 2 days ago
2009
ACM
In this paper, we observe that minimum energy Emin of subthreshold logic dramatically increases when reaching 45 nm node. We demonstrate by circuit simulation and analytical model...
EURODAC
1994
IEEE
13 years 9 months ago
1994
IEEE
synchronisation also play a fundamental role in overall system robustness. ElectroMagnetic Compatibility (EMC) and ElectroMagnetic Interference (EMI) issues also have to be conside...
MICRO
2003
IEEE
13 years 10 months ago
2003
IEEE
With increasing clock frequencies and silicon integration, power aware computing has become a critical concern in the design of embedded processors and systems-on-chip. One of the...