4 search results - page 1 / 1 » A Novel, Low-Cost Algorithm for Sequentially Untestable Faul... |
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper presents a new and low-cost approach for identifying sequentially untestable faults. Unlike the single fault theorem, where the stuck-at fault is injected only in the r...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
: This paper presents a novel, low cost technique based on implications to identify untestable bridging faults in sequential circuits. Sequential symbolic simulation [1] is first p...
ATS
2005
IEEE
13 years 11 months ago
2005
IEEE
The need for high-performance pipelined architectures has resulted in the adoption of latch based designs with multiple, interacting clocks. For such designs, time sharing across ...
ICCAD
1998
IEEE
13 years 9 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...