11 search results - page 2 / 3 » A Proposal for Routing-Based Timing-Driven Scan Chain Orderi... |
DFT
2005
IEEE
13 years 7 months ago
2005
IEEE
A built-in self-test (BIST) scheme is presented which both reduces overhead for detecting random-pattern-resistant (r.p.r.) faults as well as reduces power consumption during test...
EDBT
2006
ACM
14 years 5 months ago
2006
ACM
Abstract. Many different index structures have been proposed for spatial databases to support efficient query processing. However, most of these index structures suffer from an exp...
DFT
2002
IEEE
13 years 10 months ago
2002
IEEE
Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...
DAC
1997
ACM
13 years 9 months ago
1997
ACM
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
ICDCSW
2007
IEEE
13 years 11 months ago
2007
IEEE
Complex event processing has become increasingly important in modern applications, ranging from supply chain management for RFID tracking to real-time intrusion detection. The goa...