515 search results - page 2 / 103 » A Reduced Complexity Algorithm for Minimizing N-Detect Tests |
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, an analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test a...
COLING
2010
13 years 8 days ago
2010
In statistical machine translation, decoding without any reordering constraint is an NP-hard problem. Inversion Transduction Grammars (ITGs) exploit linguistic structure and can w...
GECCO
2007
Springer
13 years 11 months ago
2007
Springer
A limited memory version of the covariance matrix adaptation evolution strategy (CMA-ES) is presented. This algorithm, L-CMA-ES, improves the space and time complexity of the CMA-...
GLVLSI
2002
IEEE
13 years 10 months ago
2002
IEEE
We present a novel test scheduling algorithm for embedded corebased SoC’s. Given a system integrated with a set of cores and a set of test resources, we select a test for each c...
DFT
2009
IEEE
14 years 1 days ago
2009
IEEE
Recently, a new test point insertion method for pseudo-random built-in self-test (BIST) was proposed in [Yang 09] which tries to use functional flip-flops to drive control test po...