144 search results - page 2 / 29 » A Self-Test Approach Using Accumulators as Test Pattern Gene... |
CORR
2011
Springer
13 years 10 days ago
2011
Springer
This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...
FORTE
2004
13 years 6 months ago
2004
Internet software tightly integrates classic computation with communication software. Heterogeneity and complexity can be tackled with a component-based approach, where components ...
DFT
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
ISCAS
1999
IEEE
13 years 9 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...