158 search results - page 1 / 32 » A Test Pattern Generation Algorithm Exploiting Behavioral In... |
ATS
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...
VTS
1999
IEEE
13 years 9 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...
FORTE
1998
13 years 6 months ago
1998
Test generation and execution are often hampered by the large state spaces of the systems involved. In automata (or transition system) based test algorithms, taking advantage of s...
SAINT
2003
IEEE
13 years 10 months ago
2003
IEEE
The problem of identifying patterns from system call trails of UNIX processes to better model application behavior has been investigated intensively. Most existing approaches focu...
EURODAC
1994
IEEE
13 years 9 months ago
1994
IEEE
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...