60 search results - page 1 / 12 » A Test Point Insertion Algorithm for Mixed-Signal Circuits |
VTS
1999
IEEE
13 years 9 months ago
1999
IEEE
This paper presents an algorithm based on testability measurement for test point insertion of mixed-signal circuits. Two transfer function models compatible with analog models are...
ICCD
2004
IEEE
14 years 2 months ago
2004
IEEE
Increasing system complexity and test cost demands new system-level solutions for mixed-signal systems. In this paper, we present a testability analysis and DfT insertion methodol...
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
Multi-channel waveform monitoring technique enhances built-in test and diagnostic capability of mixed-signal VLSI circuits. An 8-channel prototype system incorporates adaptive sam...
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
In this paper, a novel test point insertion methodology is presented for RTL designs that aims to reduce the data volume of scan-based transition delay tests. Test points are iden...
FDL
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper proposes a methodology for the extension of SystemC to mixed signal systems. An oscillator made up of an inverter chain has been used to test the accuracy and stability...