We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...
Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Salu...
Delay faults are an increasingly important test challenge. Traditional open and bridge fault models are incomplete because only the functional fault or a subset of delay fault are...
Zhuo Li, Xiang Lu, Wangqi Qiu, Weiping Shi, D. M. ...
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
This paper presents simulation evidence supporting the use of bit transition maximization techniques in the design of hardware test pattern generators TPGs. Bit transition maximiz...
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...