SRAM-based Field Programmable Gate Arrays (FPGAs) are very susceptible to Single Event Upsets (SEUs) that may have dramatic effects on the circuits they implement. In this paper w...
As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These “soft errors” can be a nuisance or catastro...
Logic Soft Errors caused by radiation are a major concern when working with circuits that need to operate in harsh environments, such as space or avionics applications, where soft ...
Oscar Ruano, Pilar Reyes, Juan Antonio Maestro, Lu...
The importance of fault tolerance at the processor architecture level has been made increasingly important due to rapid advancements in the design and usage of high performance de...
T. S. Ganesh, Viswanathan Subramanian, Arun K. Som...
A new approach to military operations, called Anticipatory Planning and Adaptive Execution, treats planning and execution as a tightly coupled, single process, and replaces reacti...