3 search results - page 1 / 1 » A fast simultaneous input vector generation and gate replace... |
DAC
2006
ACM
14 years 5 months ago
2006
ACM
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
—1As technology scales, the aging effect caused by Negative Bias Temperature Instability (NBTI) has become a major reliability concern for circuit designers. On the other hand, r...
DAC
2005
ACM
14 years 5 months ago
2005
ACM
Input vector control (IVC) technique utilizes the stack effect in CMOS circuit to apply the minimum leakage vector (MLV) to the circuit at the sleep mode to reduce leakage. Additi...