ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
Dinos Moundanos, Jacob A. Abraham, Yatin Vasant Ho...
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, H...
Caches are crucial components in modern processors (both stand-alone or integrated into SoCs) and their test is a challenging task, especially when addressing complex and high-fre...
Wilson J. Perez, Danilo Ravotto, Edgar E. Sá...
Abstract. We propose a SAT-based algorithm for incremental diagnosis of discrete-event systems. The monotonicity is ensured by a prediction window that uses the future observations...
Diagnosability is an essential property that determines how accurate any diagnostic reasoning can be on a system given any sequence of observations. An unobservable fault event in...