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TC
1998
13 years 5 months ago
Abstraction Techniques for Validation Coverage Analysis and Test Generation
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
Dinos Moundanos, Jacob A. Abraham, Yatin Vasant Ho...
DATE
2000
IEEE
130views Hardware» more  DATE 2000»
13 years 9 months ago
Optimal Hardware Pattern Generation for Functional BIST
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, H...
ATS
2009
IEEE
127views Hardware» more  ATS 2009»
13 years 10 months ago
On the Generation of Functional Test Programs for the Cache Replacement Logic
Caches are crucial components in modern processors (both stand-alone or integrated into SoCs) and their test is a challenging task, especially when addressing complex and high-fre...
Wilson J. Perez, Danilo Ravotto, Edgar E. Sá...
ECAI
2008
Springer
13 years 7 months ago
Incremental Diagnosis of DES by Satisfiability
Abstract. We propose a SAT-based algorithm for incremental diagnosis of discrete-event systems. The monotonicity is ensured by a prediction window that uses the future observations...
Alban Grastien, Anbulagan
AAAI
2008
13 years 7 months ago
A Scalable Jointree Algorithm for Diagnosability
Diagnosability is an essential property that determines how accurate any diagnostic reasoning can be on a system given any sequence of observations. An unobservable fault event in...
Anika Schumann, Jinbo Huang