Instability of SRAM memory cells derived from the process variation and lowered supply voltage has recently been posing significant design challenges for low power SoCs. This paper...
As the IC process technology scales, the oxide thickness and operating voltage continues to decrease. The gate oxide thickness in recent and future IC process technology has appro...
In this paper, new SRAM cell design methods for FinFET technology are proposed. One of the most important features of FinFET is that the independent front and back gate can be bia...
Ubiquitous computing has become a very popular paradigm. The most suitable technological solution for those systems consists of using hybrid processors able to operate at high vol...
Bojan Maric, Jaume Abella, Francisco J. Cazorla, M...
this paper proposes a novel Process Variation Aware SRAM architecture designed to inherently support voltage scaling. The peripheral circuitry of the SRAM is modified to selectivel...
Avesta Sasan, Houman Homayoun, Ahmed M. Eltawil, F...