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» A note on fault diagnosis algorithms
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ITC
1997
IEEE
93views Hardware» more  ITC 1997»
13 years 9 months ago
Fault Diagnosis in Scan-Based BIST
A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-Based BIST is proposed. The incorporation of the superposition principle to the ...
Janusz Rajski, Jerzy Tyszer
ET
2007
111views more  ET 2007»
13 years 4 months ago
Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable Hardware
This article describes an emulation-based method for locating stuck-at faults in combinational and synchronous sequential circuits. The method is based on automatically designing a...
Fatih Kocan, Daniel G. Saab
ITC
2002
IEEE
112views Hardware» more  ITC 2002»
13 years 9 months ago
Multiplets, Models, and the Search for Meaning: Improving Per-Test Fault Diagnosis
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...
David B. Lavo, Ismed Hartanto, Tracy Larrabee
DSN
2005
IEEE
13 years 10 months ago
Design Time Reliability Analysis of Distributed Fault Tolerance Algorithms
Designing a distributed fault tolerance algorithm requires careful analysis of both fault models and diagnosis strategies. A system will fail if there are too many active faults, ...
Elizabeth Latronico, Philip Koopman