40 search results - page 2 / 8 » A sequential procedure for average power analysis of sequent... |
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
ICSE
2007
IEEE-ACM
14 years 5 months ago
2007
IEEE-ACM
The Alloy tool-set has been gaining popularity as an alternative to traditional manual testing and checking for design correctness. Alloy uses a first-order relational logic for m...
ISLPED
1997
ACM
13 years 8 months ago
1997
ACM
New measures of peak power in the context of sequential circuits are proposed. This paper presents an automatic procedure to obtain very good lower bounds on these measures as wel...
VLSID
2005
IEEE
14 years 5 months ago
2005
IEEE
We propose a novel, non-simulative, probabilistic model for switching activity in sequential circuits, capturing both spatio-temporal correlations at internal nodes and higher ord...