46 search results - page 1 / 10 » A simulation methodology for reliability analysis in multi-c... |
GLVLSI
2006
IEEE
13 years 11 months ago
2006
IEEE
Reliability has become a significant challenge for system design in new process technologies. Higher integration levels dramatically increase power densities, which leads to high...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
Aggressive technology scaling has an ever-increasing adverse impact on the lifetime reliability of microprocessors. This paper proposes a novel simulation framework for evaluating...
ET
2002
13 years 4 months ago
2002
As we approach 100nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-onchips. Voltage distortion (noise) and delay viol...
TVLSI
2008
13 years 4 months ago
2008
Lifetime concerns for complex systems-on-a-chip (SoC) designs due to decreasing levels in reliability motivate the development of solutions to ensure reliable operation. A precurso...
DAC
2006
ACM
14 years 5 months ago
2006
ACM
Modern integrated circuits (ICs) are becoming increasingly complex. The complexity makes it difficult to design, manufacture and integrate these high-performance ICs. The advent o...