106 search results - page 1 / 22 » Accurate Diagnosis of Multiple Faults |
ICCD
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper, we propose a diagnostic test generation method in conjunction with an efficient sequential SAT-based diagnosis procedure to precisely identify multiple defective si...
ET
2006
13 years 4 months ago
2006
1 Fault diagnosis of full-scan designs has been progressed significantly. However, most existing techniques are aimed at a logic block with a single fault. Strategies on top of the...
ATS
2003
IEEE
13 years 10 months ago
2003
IEEE
Fault diagnosis of full-scan designs has been progressed significantly. However, most existing techniques are aimed at a logic block with a single fault. Strategies on top of thes...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
In this paper, we propose a new circuit transformation technique in conjunction with the use of a special diagnostic test pattern, named SO-SLAT pattern, to achieve higher multipl...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
- We describe a preprocessing step to fault diagnosis of an observed response obtained from a faulty chip. In this step, a fault model for diagnosing the observed response is selec...