130 search results - page 1 / 26 » Accurate and scalable reliability analysis of logic circuits |
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Reliability of logic circuits is emerging as an important concern that may limit the benefits of continued scaling of process technology and the emergence of future technology al...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Soft errors are an increasingly serious problem for logic circuits. To estimate the effects of soft errors on such circuits, we develop a general computational framework based on ...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
— In this paper, we present an analysis methodology to compute circuit node sensitivity due to charged particle induced delay (timing) errors, Soft Delay Errors (SDE). We define...
VLSID
2007
IEEE
14 years 5 months ago
2007
IEEE
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...