26 search results - page 2 / 6 » Adaptive Diagnostic Pattern Generation for Scan Chains |
VTS
1997
IEEE
13 years 9 months ago
1997
IEEE
A new approach for testing the bistable elements (latches and flip-flops) in scan chain circuits is presented. In this approach, we generate test patterns that apply a checking ex...
ATS
2009
IEEE
14 years 4 days ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
ET
2000
13 years 5 months ago
2000
An efficient deterministic BIST scheme based on partial scan chains together with a scan selection algorithm tailored for BIST is presented. The algorithm determines a minimum num...
DAC
1997
ACM
13 years 9 months ago
1997
ACM
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
VLSID
2005
IEEE
14 years 5 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...