17 search results - page 1 / 4 » Adaptive techniques for overcoming performance degradation d... |
ASPDAC
2009
ACM
13 years 11 months ago
2009
ACM
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a major reliability concern in present-day digital circuit design. Further, with the recent usage of...
ATS
2009
IEEE
13 years 2 months ago
2009
IEEE
Negative bias temperature instability (NBTI) has been a significant reliability concern in current digital circuit design due to its effect of increasing the path delay with time a...
DATE
2010
IEEE
13 years 9 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
—Increasing power density causes die overheating due to limited cooling capacity of the package. Conventional thermal management techniques e.g. logic shutdown, clock gating, fre...
TVLSI
2008
13 years 4 months ago
2008
Thermal management is critical for integrated circuit (IC) design. With each new IC technology generation, feature sizes decrease, while operating speeds and package densities incr...