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DAC
2004
ACM
14 years 5 months ago
Statistical timing analysis in sequential circuit for on-chip global interconnect pipelining
With deep-sub-micron (DSM) technology, statistical timing analysis becomes increasingly crucial to characterize signal transmission over global interconnect wires. In this paper, ...
Lizheng Zhang, Yuhen Hu, Charlie Chung-Ping Chen
TVLSI
2008
151views more  TVLSI 2008»
13 years 4 months ago
Guest Editorial Special Section on Design Verification and Validation
ion levels. The framework also supports the generation of test constraints, which can be satisfied using a constraint solver to generate tests. A compositional verification approac...
I. Harris, D. Pradhan
TCAD
2008
101views more  TCAD 2008»
13 years 4 months ago
Using Field-Repairable Control Logic to Correct Design Errors in Microprocessors
Functional correctness is a vital attribute of any hardware design. Unfortunately, due to extremely complex architectures, widespread components, such as microprocessors, are often...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
DSN
2011
IEEE
12 years 4 months ago
Cross-layer resilience using wearout aware design flow
—As process technology shrinks devices, circuits experience accelerated wearout. Monitoring wearout will be critical for improving the efficiency of error detection and correctio...
Bardia Zandian, Murali Annavaram
DAC
2002
ACM
14 years 5 months ago
High-Level specification and automatic generation of IP interface monitors
A central problem in functional verification is to check that a circuit block is producing correct outputs while enforcing that the environment is providing legal inputs. To attac...
Marcio T. Oliveira, Alan J. Hu