Increasing non-recurring engineering (NRE) and mask costs are making it harder to turn to hardwired Application Specific Integrated Circuit (ASIC) solutions for high performance a...
ABSTRACT: We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the...
Brooks R. Garrison, Daniel T. Milton, Charles E. S...
Dynamically reconfigurable architectures or systems are able to reconfigure their function and/or structure to suit changing needs of a computation during run time. The increasing...
As device size shrinks to the nanometer range, FPGAs are increasingly prone to manufacturing defects. We anticipate that the ability to tolerate multiple defects will be very impo...