16 search results - page 1 / 4 » An Automatic Test Pattern Generation Framework for Combinati... |
ICCD
2004
IEEE
14 years 2 months ago
2004
IEEE
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
ATS
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
ASE
2004
13 years 5 months ago
2004
TestEra is a framework for automated specification-based testing of Java programs. TestEra requires as input a Java method (in sourcecode or bytecode), a formal specification of th...
SEKE
2005
Springer
13 years 10 months ago
2005
Springer
The paper presents an approach to support run-time verification of software systems that combines two existing tools, Prospec and Java-MaC, into a single framework. Prospec can be...
SPIN
2010
Springer
13 years 3 months ago
2010
Springer
In the field of communication networks, protocol engineers usually employ several tools focused on specific kinds of analysis, such as performance or correctness. This paper pres...