39 search results - page 2 / 8 » An Automatic Test Pattern Generator for Large Sequential Cir... |
ICCAD
1998
IEEE
13 years 9 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
VTS
1996
IEEE
13 years 9 months ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
IWANN
1995
Springer
13 years 8 months ago
1995
Springer
This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...
EVOW
1999
Springer
13 years 9 months ago
1999
Springer
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...
ATS
1997
IEEE
13 years 9 months ago
1997
IEEE
Testing circuits which do not include a global reset signal requires either complex ATPG algorithms based on 9- or even 256-valued algebras, or some suitable method to generate in...