39 search results - page 3 / 8 » An Automatic Test Pattern Generator for Large Sequential Cir... |
VTS
1998
IEEE
13 years 10 months ago
1998
IEEE
This paper presents a BIST architecture for Finite State Machines that exploits Cellular Automata (CA) as pattern generators and signature analyzers. The main advantage of the pro...
VTS
1999
IEEE
13 years 10 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...
DATE
1999
IEEE
13 years 10 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
COR
2008
2008
Observations in using parallel and sequential evolutionary algorithms for automatic software testing
13 years 5 months ago
In this paper we analyze the application of parallel and sequential evolutionary algorithms (EAs) to the automatic test data generation problem. The problem consists of automatica...
FPL
2004
Springer
13 years 11 months ago
2004
Springer
Abstract. We present an evaluation of accelerating fault simulation by hardware emulation on FPGA. Fault simulation is an important subtask in test pattern generation and it is fre...