60 search results - page 1 / 12 » An Efficient Path Delay Fault Coverage Estimator |
DAC
1994
ACM
14 years 1 months ago
1994
ACM
DATE
2002
IEEE
14 years 2 months ago
2002
IEEE
The problem of fault grading for multiple path delay faults is studied and a method of obtaining the exact coverage is presented. The faults covered are represented and manipulate...
ICCAD
2003
IEEE
14 years 6 months ago
2003
IEEE
Path delay fault testing becomes increasingly important due to higher clock rates and higher process variability caused by shrinking geometries. Achieving high-coverage path delay...
IFIP
2001
Springer
14 years 1 months ago
2001
Springer
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
VLSID
1996
IEEE
14 years 1 months ago
1996
IEEE
W epropose a coverage metric and a two-pass test generation method for path delay faults in combinational logic circuits. The coverage is measured for each line with a rising and ...